Life Sciences (Services) SEM Home Page Instrumentation Introduction to electron microscopy How an SEM works Beam / sample interactions Setting up the microscope Preparing the sample Critical point drying (CPD) Mounting the sample Sputter coating (Gold) Carbon Coating Cryo-Stage SEM Image Gallery 2005 Wellcome Trust Image Award	Instrumentation
	Leo S420 stereoscan
	Secondary electron detector For good quality images show surface features
	Backscattered electron detector Image shows the different modes the backscatter detector can be set in with a secondary image for comparison Left Secondary image Center Backscattered-Composition Right Backscattered -Topology
	Inca 200 X-ray detector       Elemental analysis This system may be used to determine which elements are present in a sample   Elemental mapping This system may also be used to produce a map to show the distribution of each element is located within a sample All data can be exported directly into a report as a Microsoft word document
	Accurate measuring Accurate measurements can be made on screen from either live or stored images